The breakdown in a reverse biased $p-n$ junction diode is more likely to occur due to

  • A
    large velocity of the minority charge carriers if the doping concentration is small
  • B
    large velocity of the minority charge carriers if the doping concentration is large
  • C
    strong electric field in a depletion region if the doping concentration is small
  • D
    none of these

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Diffusion current in a $p-n$ junction is greater than the drift current in magnitude when:

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