Angular width of the central maximum of a diffraction pattern due to a single slit does not depend upon:

Yellow light is used in a single slit diffraction experiment with a slit width of $0.6 \, mm$. If the yellow light is replaced by $X$-rays,then the pattern will reveal:

If the measured angular separation between the second minimum to the left of the central maximum and the third minimum to the right of the central maximum is $30^{\circ}$ in a single slit diffraction pattern recorded using $628 \ nm$ light,then the width of the slit is . . . . . . $\mu m$.

Consider the diffraction pattern obtained from the sunlight incident on a pinhole of diameter $0.1 \, \mu m$. If the diameter of the pinhole is slightly increased,it will affect the diffraction pattern such that :

$A$ beam of light having wavelength $5400 \text{ Å}$ from a distant source falls on a single slit $0.96 \text{ mm}$ wide and the resultant diffraction pattern is observed on a screen $2 \text{ m}$ away. What is the distance between the first dark fringe on either side of the central bright fringe (in $\text{mm}$)?

$A$ parallel beam of fast-moving electrons is incident normally on a narrow slit. $A$ fluorescent screen is placed at a large distance from the slit. If the speed of the electrons is increased,which of the following statements is correct?